Evaluation of Fowler-Nordheim Tunneling in Metal-Insulator-Metal (MIM) Diodes with Lower Amorphous Metal Electrodes
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Type:
SSO Seminar
Date-Time:
Wed, 2012-05-23 16:00 - 17:00
Location:
Weniger 304
Event Speaker:
Bill Cowell (OSU EECS)
Local Contact:
Yun-Shik Lee Abstract:
Electronic conduction in metal-insulator-metal (MIM) diodes is categorized as bulk-limited or electrode-limited. An overview of representative conduction mechanisms is described through mathematical current-voltage equations and the use of energy band diagrams. An analytic methodology for Fowler-Nordheim tunneling, an electrode-limited conduction mechanism, is described in detail. Tunneling MIM diode current-voltage data is presented to illustrate modulation of current-voltage characteristics via fabrication parameters.