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Three novel strategies for the structurally identification of nanocrystals in a Transmission Electron Microscope (TEM) are presented. Either a single High-Resolution Transmission Electron Microscopy (HRTEM) image or a single Precession Electron Diffractogram (PED) may be utilized. The structural identification information is in both cases collected from individual nanocrystals. PEDs from fine-grained crystal powders may also be used.