Events
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13
| 14
Start: 2008-04-14 16:00
End: 2008-04-14 18:00
In this talk, I will describe our experiments of using non-contact atomic force microscopy (AFM) to probe local properties of nanostructures. The AFM tip is used as a mobile gate to perturb samples locally and at the same time a sensor to detect minute electrostatic forces due to single electron charging (~ 10 /f/N). This technique allows us to track the charging process of a semiconducting carbon nanotube with high spatial and energetic resolution and provide a map of its local potential fluctuations. | 15
| 16
Start: 2008-04-16 16:00
End: 2008-04-16 18:00
This isn't about solid state or optical physics, but should be of interest to current and prospective graduate students, and those who interact with them in any capacity. People who attended this conference promised to report back to their departments, and I'd like to take this opportunity to do so. An APS/AAPT-sponsored conference to focus national attention on graduate education in physics took place at the American Center for Physics (ACP) in College Park, MD from January 30 � February 2, 2008. | 17
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