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« Thursday May 24, 2007 »
Thu
Start: 2007-05-24 16:00
End: 2007-05-24 18:00

Knowledge of atomic structural arrangements and composition at surfaces and buried interfaces is fundamental to our understanding of the function and properties of fabricated thin-film structures. Because of favorable cross sections, x-rays offer a unique opportunity to penetrate through gas, liquid, or solid thin-film overlayers to probe the structure and chemistry of surfaces and internal boundaries on the atomic length scale.

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